High-resolution field emission scanning electron microscope (HR-FESEM) and EDAX

High-resolution field emission scanning electron microscope (HR-FESEM) and EDAX

High Resolution Transmission Electron Microscope (HRTEM) with EDAX

Instrument specification

Thermo Scientfic Verios G4 UC High resolution field emission scanning electron microscope (FESEM) operates at a variety of voltages ranging from 2 – 30 kV. It has Schottky FEG electron gun having an adjustable probe current ranging between 0.8 nA – 100 nA. It has a magnification of over 1,000,000 x providing a high resolution of 0.6 nm. FESEM operates under a vacuum system that is entirely oil-free. Differential pumping on the electron column ensures tip operation at the ultra-high vacuum levels (10-10 mbar).

Technicalities

The Verios G4 UC features through-the-lens (TLD) SE and BSE detection specifically designed for high-resolution

imaging at both high and low kVs, as well as an Everhart-Thornley SE detector for conventional SE detection. The in-lens SE detector features a technique where the energy range of the detected secondary electrons can be selected. The sample stage can be rotated 360 o and tiled to – 60 o making the system very versatile. Scan rate for the system ranges from 50 ms all the way upto 50 s.

Key features

  • Resolution: 0.6 nm
  • Magnification range between 100 – 1,000,000 x.
  • Working distance of 15 cm to least working distance of 3 cm.
  • Sample can be tilted (-60 o) and rotated (360 o).
  • Operating voltage between 2 – 30 kV.
  • Consists of SE and BSE mode and EDAX for elemental analysis. Having both line, spot and mapping capabilities.

Theory of operation

A scanning electron microscope is a type of electron microscope that produces images of sample by scanning the surface of the sample with a focused beam of electrons. These electrons interact with atoms in the sample, producing various signals that contain information about the surface topology and composition of the sample. Electron beam upon impact with the surface emits, secondary electrons, back scattered electrons, characteristic X-rays and light. These captured by various detectors.

To learn more about the working principle of SEM, please visit, https://en.wikipedia.org/wiki/Scanning_electron_microscope

Sample Images/data:

High-resolution transmission electron microscopy (HRTEM)

High-resolution transm...

JEOL 3010 with a UHR polepiece operates at an accelerating voltage 300 kV. Depending upon the sample compatibility, it can work at three different accelerating voltages i.e., 300, 200 and 100 kV.

Read more
Confocal Raman Microscope (CRM-Alpha300 S)

Confocal Raman Microsc...

The confocal Raman Microscope, CRM a300 S(WITec GmbH) is the best of its class instrument that combines in a unique way the operations of confocal microscopy, Raman spectroscopy, AFM, and SNOM.

Read more
Field Emission Scanning Electron Microscope

Field Emission Scannin...

The Verios G4 UC features through-the-lens (TLD) SE and BSE detection specifically designed for high-resolution imaging at both high and low kVs, as well as an Everhart-Thornley SE detector for conventional SE detection. The in-lens SE detector features a technique where the energy range of the detected secondary electrons can be selected. The sample stage can be rotated 360 o and tiled to – 60 o making the system very versatile. Scan rate for the system ranges from 50 ms all the way upto 50 s.

Read more
Inverted Fluorescence Microscope

Inverted Fluorescence ...

Leica DMI3000 B is an inverted microscope and can be used for fluorescence imaging of materials and biological samples.

Read more
Hyperspectral Imaging

Hyperspectral Imaging

Hyperspectral Imaging System (HSI) provides spectral analysis of materials and biologicals imaged with the nano-scale optical microscope operating in the visible near…

Read more
Phase Contrast Microscope

Phase Contrast Microscope

Leica DM IL LED is an inverted microscope equipped with phase shift rings and gray filters for phase contrast microscopy. Although phase changes in the light transmitted through samples are invisible, they can be made visible when they are converted in to brightness variations and provide improved contrast in the image

Read more

Deprecated: File Theme without footer.php is deprecated since version 3.0.0 with no alternative available. Please include a footer.php template in your theme. in /opt/bitnami/wordpress/wp-includes/functions.php on line 6078